Ionizing Radiation Effects In Mos Oxides
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As a result of work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation, the understanding of the basic physical mechanisms has evolved. This text summarizes the new work and integrates it with older work to form a unified picture.
Информация за "Ionizing Radiation Effects In Mos Oxides"
- SKU 9789810233266
- Weight 0.396000
- ISBN 9789810233266
- Вид корица Hardback
- Издателство World Scientific Publishing Co Pte Ltd
- Брой страници 188
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